Publication List

Journal Paper

1.           Ya-Chin King; Bin Yu; J. Pohlman; Chenming Hu."Punchthrough transient voltage suppressor for low-voltage electronics.", IEEE Electron Device Letters, July 1995, vol.16, (no.7): 303.

 

2.           Ya-Chin King; Bin Yu; J. Pohlman; Chenming Hu."Punchthrough diode as the transient voltage suppressor for low-voltage electronics.", IEEE Transactions on Electron Devices, Nov. 1996, vol.43, (no.11): 2037.

 

3.           Ya-Chin King; Hiroshi Fujioka; Shiroo Kamohara ;Chenming Hu., "Small-signal electron charge centroid Model for quantization of Inversion Layer in a metal-on-insulator field-effect transistor", Applied Physics Letters, June 1998, vol.72, (no. 26): 3476.

 

4.           Wen-Chin Lee;Ya-Chin King; Tsu-Jae King ; Chenming Hu."Investigation of Poly-Si1-xGex for Dual-Gate CMOS Technology", IEEE Electron Device Letters, July 1998, vol.19, ( no. 7): 247.

 

5.           Wen-Chin Lee; Ya-Chin King; Tsu-Jae King; Chenming Hu."Observation of reduced poly-gate depletion effect for poly-Si0.8Ge0.2-gated NMOS devices." Electrochemical and Solid-State Letters, July 1998, vol.1, (no.1): 58.

 

6.           Chenming Hu; Donggun Park; Ya-Chin King."Thin Gate Oxides Promise High Reliability ", Semiconductor International, July 1998, p.215

 

7.           Ya-Chin King; Hiroshi Fujioka; Shiroo Kamohara; Kai Chen; Chenming Hu. ¡§DC Electrical Oxide Thickness Model for Quantization of the Inversion Layer in MOSFETs¡¨, Semiconductor Science and Technology, August 1998, (no.13): 963

 

8.           Dunggun Park, Ya-Chin King, Qiang Lu, Tsu-Jae King, Chenming Hu, and Others. ¡§Transistor Characteristics with Ta2O5 Gate Dielectric¡¨, IEEE Electron Device Letters, November 1998, vol. 19,( no. 11): 441

 

9.           W. Liu; X. Jin; Ya-Chin King; Chenming Hu.,¡§An efficient and accurate compact model for thin-oxide-MOSFET intrinsic capacitance considering the finite charge layer thickness.¡¨, IEEE Transactions on Electron Devices, May 1999, vol.46, (no.5): 1070.

 

10.       Kevin Yang; Chenming Hu; and Ya-Chin King. "Oxide Thickness Characterization: Models for Quantum Effect," Solid State Technology, Taiwan, no. 6, p. 51, 1999

 

11.       Ya-Chin King; Tsu-Jae King; Chenming Hu. ¡§A long-refresh dynamic/quasi-nonvolatile memory device with 2-nm tunneling oxide.¡¨IEEE Electron Device Letters, Aug. 1999, vol.20, (no.8): 409.  

 

12.       A.H.-F. Chou; Wei-Zhe Wong; Jang, E.C.-S.; Yu-Yuan Yao; Ya-Chin King ; Charles Hsu."Comprehensive study of a new self-convergent programming scheme for split gate flash memory.", Japanese Journal of Applied Physics, April 2000, vol.39, (no.4B): 2219.

 

13.       A.H.-F. Chou; Yang, E.C.-S.; Wei-Zhe Wong; Ya-Chin King ; Charles Hsu. "A new bit-line-controlled self-convergent multilevel AND-type flash memory. ", Japanese Journal of Applied Physics, April 2000, vol.39, (no.4B): 2215.

 

14.       Frank Lin; S.-Y. Lin; M.-L. Lee; C.-H. Boe; C.-P. Yeh; P.-H. Wu; N. J.; Ya-Chin King; Charles Hsu , "Novel source-controlled self-verified programming for multilevel EEPROMs ", IEEE Transactions on Electron Devices, Volume: 47 Issue: 6, June 2000: 1166 -1174

 

15.       Hai-Ming Lee; Cheg-Jye Liu; Chih-Wei Hsu; Mong-Song Liang; Ya-Chin King ; Charles Hsu. "New Trap-Assisted Band-to-Band Tunneling Induced Gate Current Model for P-channel MOSFET with Sub-3nm Oxides", Japanese Journal of Applied Physics, vol. 40, March 2001:1218-1221

 

16.       Yen-Sun Wang, Tsai HP, Yang ECS, King YC, Chen S, Hsu CCH, "A Body-Effect-assisted NOR-type (BeNOR) multilevel flash memory", Japanese Journal of Applied Physics, vol. 40, April 2001: 2954-2957

 

17.       Ya-Chin King; Tsu-Jae King; Chenming Hu., "Charge-trap memory device fabricated by oxidation of Si1-xGex", IEEE Transactions on Electron Devices, Volume: 48, Issue: 4, April 2001: 696 -700

 

18.       Ya-Chin King; Charles Kuo; Tsu-Jae King; Chenming Hu., "Optimization of sub-5nm multiple-thickness gate oxide formed by oxygen implantation", IEEE Transactions on Electron Devices, Volume: 48, Issue: 6, June 2001: 1279 -1281

 

19.       Chou AHF, Yang ECS, Liu CJ, Pong HH, Liaw MC, Chao TS, King YC, Hwang HL, Hsu CCH, "Comprehensive study on a novel bidirectional tunneling program/erase NOR-type (BiNOR) flash memory cell" , IEEE Transactions on Electron Devices, July 2001 , vol. 48: (7): 1386-1393

 

20.       Hsiu-Yu Cheng, Hsien-Chun Chang, Sing-Rong Li, Liang-Wei Lai, Ya-Chin King, ¡§A New Photodiode Structure with Optical Window for High-Sensitivity CMOS Imagers¡¨, Japanese Journal of Applied Physics, vol. 41, April 2002:2326-2328

 

21.       Hsiu-Yu Cheng, Ya-Chin King, ¡§An Ultra-Low Dark Current CMOS Image Sensor Using n+ Ring Reset¡¨, IEEE Electron Device Letters, vol. 23, Sept. 2002:538-540

 

22.       Hai-Ming Lee, Long-Jye Du, Mong-Song Liang, Ya-Chin King, Charles Ching-Hsiang, ¡§A Unified Functional Reliablity Model for N-channel MOSFET with Sub 2nm Gate Oxide¡¨, Japanese Journal of Applied Physics, vol. 41, September 2002: 5546-5550

 

23.       Hsiu-Yu Cheng, Ya-Chin King, ¡§A CMOS Image Sensor with Dark-Current Cancellation and Dynamic Sensitivity Operations¡¨, IEEE Transactions on Electron Devices, vol. 50, no. 1, Jan. 2003:91-95

 

24.       Sing ¡VRong Lee, Cheng-Hisiao Lai, Ya-Chin King, ¡§A New Sampling Scheme for High Sensitive, Extended Dynamic Range CMOS Imaging Pixel Sensors¡¨ , Japanese Journal of Applied Physics, vol. 42, April 2003:2159-2162

 

25.       Hsien-Chun Chang, Ya-Chin King, ¡§Tunable Injection Current Compensation Architecture for High Fill-Factor Self-Buffered Active Pixel Sensor¡¨, IEEE Sensor Journal, vol.3, no4, August 2003:525-532

 

26.       Liang-Wei Lai,, Cheng-Hisiao Lai, Ya-Chin King, ¡§A novel logarithmic response CMOS image sensor with high output voltage swing and in-pixel fixed-pattern noise reduction¡¨, IEEE SENSORS JOURNAL 4 (1): 122-126 FEB 2004

 

27.       Po-Hao Huang, Hsiu-Yu Cheng, Wen-Jen Chiang, Cheng-Hsiao Lia and Ya-Chin King, ¡§Optimization of The Ultra-Low Dark Current Complementary MOS Image Sensor Using n+ Ring Reset¡¨, Japanese Journal of Applied Physics, vol. 43, no 4B, April 2004:1734-1736

 

28.       Wei-Cheng Lin; Long-Jei Du; Ya-Chin King; "Reliability Evaluation and Redesign of LNA", Microelectronics Reliability, Volume: 44, Issue: 9-11, Sep.-Nov. 2004: 1727-1732

 

29.       Kung-Hong Lee; Ya-Chin King, ¡§High-Density Single-Poly Electrically Erasable Programmable Logic Device for Embedded Nonvolatile Memory Applications¡¨, Japanese Journal of Applied Physics, vol. 44, no 1A, January, 2005:44-49

 

30.       Kung-Hong Lee; Ya-Chin King, ¡§ Embedded Ultra High Density Flash Memory Cell and Corresponding Array Architecture¡¨, Japanese Journal of Applied Physics, vol. 44, no 4B, April, 2005: 2083-2087

 

31.       Cheng-Hsiao Lai, Yueh-Ping Yu; Kung-Hong Lee; Ya-Chin King, ¡§A New Well Capacity Adjusting Scheme for High Sensitivity, Extended Dynamic Range CMOS Imaging Pixel Sensors¡¨, Japanese Journal of Applied Physics, vol. 44, no 4B, April, 2005: 2214-2216

 

32.       Wei-Cheng Lin; Tsung-Chien Wu; Yi-Hung Tsai; Long-Jei Du; Ya-Chin King;¡§Reliability evaluation of class-E and class-a power amplifiers with nanoscaled CMOS technology¡¨, IEEE Transactions on Electron Devices, Volume 52,  Issue 7,  July 2005: Page(s):1478 ¡V 1483

33.       Ling-Chang Hu, An-Chi Kang*, T.I. Wu*, Eric Chen*, J.R. Shih*, H.W. Chin*, Yao-Feng Lin*, Kenneth Wu*, Ya-Chin King, ¡¨Gate stress effect on low temperature data retention characteristics of split-gate flash memories¡¨ , Microelectronics Reliability, Volume: 45, Issue: 9-11, Sep.-Nov. 2005: 1331-1336

34.       Kung-Hong Lee, Shih-Cheng Wang, Ya-Chin King, ¡§Self-convergent scheme for logic-process-based multilevel/analog memory¡¨, IEEE Transactions on Electron Devices, Volume 52,  Issue 12,  December 2005: Page(s):2676-2681

35.       Ying-Chieh Chuang; Shih-Fang Chen; Shi-Yu Huang; Ya-Chin King; ¡§Low-cost logarithmic CMOS image sensing by nonlinear analog-to-digital conversion¡¨, IEEE Transactions on Consumer Electronics, Volume 51,  Issue 4,  Nov. 2005 Page(s):1212 ¡V 1217

36.       Wu MY; Dai SH; Hu SF; E.C.-S.; Hsu, C.C.-H.; King, Y.-C.; ¡§Highly scalable ballistic injection AND-type (BiAND) flash memory¡¨, IEEE Transactions on Electron Devices, 53(1): 109 ¡V 111, Jan 2006

37.       Chang, Y.-W.; Chang, H.-W.; Lu, T.-C.; King, Y.-C.; Ting, W.; Ku, Y.-H.J.; Lu, C.-Y.; ¡§Interconnect Capacitance Characterization Using Charge-Injection-Induced Error-Free (CIEF) Charge-Based Capacitance Measurement (CBCM)¡¨, IEEE Transactions on Semiconductor Manufacturing, 19(1): 50 ¡V 56 FEB 2006

38.       Wu MY; Dai SH; Hu SF; Yang, E.C.-S.; Hsu, C.C.-H.; King YC;¡¨Comprehensively study on a ballistic-injection AND-type flash memory cell¡¨, Japanese Journal of Applied Physics, 45(2A): 674-679 FEB. 2006

39.       Lai CH, King YC, Huang SY, ¡§A 1.2-V 0.25-mu m clock output pixel architecture with wide dynamic range and self-offset cancellation¡¨, IEEE SENSORS JOURNAL 6 (2): 398-405 APR 2006

40.       Hsieh SI, Chen HT, Chen YC, Chen CL, King YC. ¡§ MONOS memory in sequential laterally solidified low-temperature poly-Si TFTs¡¨  IEEE ELECTRON DEVICE LETTERS 27 (4): 272-274 APR 2006

41.        Hu LC, Kang AC, Shih JR, Lin YF, Wu K, King YC, ¡§Statistical modeling for postcycling data retention of split-gate flash memories¡¨,  IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY 6 (1): 60-66 MAR 2006

42.       Chang YW, Chang HW, Lu TC, King YC, Ting WC, Ku YHJ, Lu CY, ¡§Charge-based capacitance measurement for bias-dependent capacitance¡¨, IEEE ELECTRON DEVICE LETTERS 27 (5): 390-392 MAY 2006

43.       Lai CH, Lai LW, Chiang WJ, King YC , ¡§A logarithmic response complementary metal oxide semiconductor image sensor with parasitic P-N-P bipolar junction transistor¡¨, JAPANESE JOURNAL OF APPLIED PHYSICS 45 (4B): 3251-3255 APR 2006

44.       Hsieh SI, Chen HT, Chen YC, Chen CL, Lin JX, King YC, ¡§ Reliability and memory characteristics of sequential laterally solidified low temperature polycrystalline silicon thin film transistors with an oxide-nitride-oxide stack gate dielectric¡¨, JAPANESE JOURNAL OF APPLIED PHYSICS 45 (4B): 3154-3158 APR 2006

45.       Wu MY, Dai SH, Lee KH, Hu SF, King YC, ¡§ Band-to-band tunneling induced substrate hot electron injection (BBISHE) to perform programming for NOR flash memory¡¨, SOLID-STATE ELECTRONICS 50 (3): 309-315 MAR 2006

46.        Hsieh SI, Chen HT, Chen YC, Chen CL, King YC, ¡§Threshold voltage uniformity enhancement for low-temperature polysilicon thin-film transistors using tilt alignment technique¡¨, ELECTROCHEMICAL AND SOLID STATE LETTERS 9 (7): H57-H60 2006

47.        Chen HT, Chen YC, Lin JX, Hsieh SI, King YC,¡§Roughness effect on uniformity and reliability of sequential lateral solidified low-temperature polycrystalline silicon thin-film transistor¡¨, ELECTROCHEMICAL AND SOLID STATE LETTERS 9 (8): H81-H83 2006

 


¡@

Conference Paper

 

1.           Bin Yu; Ya-Chin King; Pohlman, J.; Chenming Hu. "Punchthrough transient voltage suppressor for EOS/ESD protection of low-voltage IC's.", Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 1995, p. 27.

 

2.           Zhang, G.; King, Y.; Elfoukhy, S.; Hamdy, E.; and others. "On-state reliability of amorphous silicon antifuses", International Electron Devices Meeting. Technical Digest, 1995, p. 551.

 

3.           Fujioka, H.; Wann, H.-J.; Park, D.-G.; King, Y.-C.; and others. "Tunneling current through MIS structures with ultra-thin insulators.", Materials Reliability in Microelectronics VI. Symposium. Material Research Society, 1996. p. 415

 

4.           Shiro Kamohara; Ya-Chin King; Kai Chen; Dongun Park; and others. "MOSFET carrier mobility model based on the density-of-state at the DC-centroid in the quantized inversion layer.", International Conference on VLSI and CAD, Seoul, South Korea, 1997. p.171.

 

5.           Ya-Chin King; Hisorhi Fujioka; Shiroo Kamaharo; Wen-Chin Lee, Chenming Hu."AC Charge Centroid Model for Quantization of Inversion Layer in n-MOSFET",, Proceedings of Technical Papers of 1997 International Symposium on VLSI Technology, system and Applications, p.245

 

6.           Ya-Chin King, Tsu-Jae King, Chenming Hu.¡§Sub-5nm Multiple-Thickness Gate Oxide Technology Using Oxygen Implantation¡¨, Proceedings of Technical Papers of International Electron Device Meeting, December 1998, p. 585

 

7.           Ya-Chin King, Tsu-Jae King, Chenming Hu. ¡§MOS Memory Using Germanium Nanocrystals Formed by Thermal Oxidation of Si1-x Gex¡¨, Proceedings of Technical Papers of International Electron Device Meeting, December 1998, p. 115

 

8.           Kevin J. Yang, Ya-Chin King, Chenming Hu., ¡§Quantum Effect in Oxide Thickness Determination from Capacitance Measurement¡¨, Proceeding of the VLSI technology, June 1999, p.77

 

9.           Amy H.-F. Chou; Evans Ching-Song Yang; Wei-Zhe Wong; Ya-Chin King ; Charles Hsu. " A New-bitline-controlled Self-convergent Multi-level AND type Flash Memory" International Conference on Solid State Device and Materials, pp. 536-537, Tokyo, Japan, 1999.

 

10.       Amy H.-F. Chou; Wei-Zhe Wong; Evans Ching-Song Yang, Yu-Yuan Yao; Yen-Sen Wang; Ya-Chin King; Charles Hsu., "Comprehensive study of a new self-convergent programming scheme for split gate flash memory." International Conference on Solid State Device and Materials, pp. 540-541, Tokyo, Japan, 1999.

 

11.       Amy H.-F. Chou; Yu-Yuan Yao,; Wei-Zhe Wong; Evans Ching-Song Yang, Yen-Sen Wang; Ya-Chin King ; Charles Hsu."New Coupling Ratio Extraction Method for Split Gate Flash Memory.", Non-volatile Workshop, Montery, U.S.A., 2000, pp. 84-85,

 

12.       Chen-Hsiao Lai; Ling-Chang Hu; Hai-Ming Lee; Long-Je Do; Ya-Chin King."New Stack Gate Insulator Structure-Reduce FIBL Effect Obviously", International Symposium on VLSI Technology, system and Applications (Hsinchu, Taiwan) , April 2001, T45.

 

13.       Min She, Ya-Chin King, Tsu-Jae King and Chenming Hu. "Modeling and Design Study of Nanocrystal Memory Devices", 59th Annual Device Research Conference, (Notre Dame, Indiana, USA), June 2001

 

14.       Hsiu-Yu Cheng, Hsien-Chun Chang, Shing-Rung Li, Liang-Wei Lai, Shuh-Sen Lin and Ya-Chin King , "A New Photodiode Structure with Spacer Window for High Sensitivity 0.35-µm CMOS Imagers", 2001 International Conference on Solid State Devices and Materials, Tokyo, September 2001, pp.286-287

 

15.       Liang-Wei Lai, Ya-Chin King, ¡§A Novel Logarithmic Response CMOS Image Sensor With High Output Voltage Swing and In-pixel Fixed Pattern Noise Reduction¡¨, The Third IEEE Asia Pacific Conference on ASICs,  August 2002

 

16.       Hsien-Chun Chang, Ya-Chin King, ¡§Tunable Injection Current Compensation Architecture for High Fill-factor Self-buffered Active Pixel Sensor¡¨, The Third IEEE Asia Pacific Conference on ASICs, 6-8 August 2002

 

17.       Sing ¡VRong Lee, Ya-Chin King, ¡§ A New Sampling Scheme for High Sensitive, Extended Dynamic Range CMOS Imaging Pixel Sensors¡¨, 2002 International Conference on Solid State Devices and Materials, Tokyo, September 2002

 

18.       Shih-Fang, Chen Ying-Jie Juang, Shi-Yu Huang, Ya-Chin King, ¡§Logarithmic CMOS Image Sensor Through Multi-Resolution Analog-To-Digital Conversion¡¨, International Symposium on VLSI Technology, system and Applications (Hsinchu, Taiwan) , Sept. 2003

 

19.       Lai, H.C.; Zous, N.K.; Tsai, W.J.; Lu, T.C.; Tahui Wang; King, Y.C.; Pan, S.¡§Reliable extraction of interface states from charge pumping method in ultra-thin gate oxide MOSFET's ¡¨, International Conference on Microelectronic Test Structures, March 17 - 20, 2003

 

20.       Wei-Cheng Lin, Long-Jei Du and Ya-Chin King, ¡§Reliability Evaluation of Voltage Controlled Oscillators Based On a Device Degradation Sub-Circuit Model¡¨, Radio Frequency Integrated Circuits Symposium, Philadelphia, U.S.A., June 2003

 

21.       Kung-Hong Lee, Ya-Chin King, ¡§New Single-poly EEPROM with Cell Size down to 8F2 for High Density Embedded Nonvolatile Memory Applications¡¨, VLSI Technology Symposium, Kyoto Japan, June 2003

 

22.                 Sean Chang, Evans Yang, Terry Chen, Da Sung, Jiang-Chi Duh, Chi-Wei Hung, Vincent Huang, Ya-Chin King, Chih-Hsiun Chu, Charles Hsu, ¡§New Bi-Directional Tunneling Program/Erase AND  Flash Memory for Multi-Level Storage Applications¡¨, 2003 VLSI Technology Symposium, Kyoto Japan, June 2003

 

23.       Po-Hao Huang, Ya-Chin King, ¡§Optimization of The Ultra-Low Dark Current CMOS Image Sensor Cell Using n+ Ring Reset¡¨, International Conference on Solid State Devices and Materials, Tokyo, September 2003

 

24.       Wei-Cheng Lin, Long-Jei Du and Ya-Chin King, "Reliability Evaluation and Comparison of Class-E and Class-A Power Amplifiers with 0.18 um CMOS Technology", IEEE International Reliability Physics Symposium (IRPS), Phoenix, Arizona, U.S.A., April 2004

 

25.       Hu, Ling-Chang; Kang, An-Chi; Liu, I-Tai; Lin, Yao-Feng; Wu, Kenneth; King, Ya-Chin , ¡§Statistical modeling for post-cycling data retention of split-gate flash memories¡¨, Annual Proceedings - Reliability Physics (Symposium), 2004, p 643-644

 

26.       Wei-Cheng Lin, Long-Jei Du and Ya-Chin King, "Reliability Evaluation of Gilbert Cell Mixer Based On a Hot-Carrier Stressed Device Degradation Model", IEEE Radio Frequency Integrated Circuits Symposium (RFIC), Fort Worth, TX, U.S.A., June 2004

 

27.       Che-I Lin, Cheng-Hsiao Lai, Ya-Chin King, ¡§A Four Transistor CMOS Active Pixel Sensor with High Dynamic Range Operation,¡¨ The Fourth IEEE Asia Pacific Conference on ASICs, Tokyo, 2004

 

28.       Kung-Hong Lee, Meng-Yi Wu, Sen-Hue Dai and Ya-Chin King, ¡§CMOS-process-based ultra high density Flash Memory Cell and Array Architecture¡¨, Proceeding for 2004 International Conference on Solid State Devices and Materials, Tokyo, 2004

 

29.       Cheng-Hsiao Lai, Yueh-Ping Yu, Ya-Chin King, ¡§A New Well Capacity Adjusting Scheme for High Sensitivity, Extended Dynamic Range CMOS Imaging Pixel Sensors¡¨, Proceeding for 2004 International Conference on Solid State Devices and Materials, Tokyo, 2004

 

30.       Meng-yi Wu, Kung-Hong Lee1, Sen-Hue Dai1, Shu-Fen Hu,Ya-Chin King, ¡§Low Voltage and High Speed Efficient Flash Using Band-to-Band Tunneling Induced Substrate Hot Electron Injection (BBISHE) to Perform Programming.¡¨, Proceeding for 2004 International Conference on Solid State Devices and Materials, Tokyo, 2004

 

31.       Cheng-Hsiao Lai, Ya-Chin King, Shi-yu Huang, ¡§A 1.2V 0.25-µm Clock Output Pixel Sensor with Wide Dynamic Range¡¨, Proceeding for 2005 International Electronic Imaging Conference, San Jose, U.S.A.

 

32.       Ling-Chang Hu, An-Chi Kang*, T.I. Wu*, Eric Chen*, J.R. Shih*, H.W. Chin*, Yao-Feng Lin*, Kenneth Wu*, Ya-Chin King, ¡§A Voltage Acceleration Lifetime Model to Predict Post-Cycling LTDR Characteristics of Split-Gate Flash Memories¡¨, Annual Proceedings - Reliability Physics (Symposium), 2005

 

33.       Ssu-I Hsieh and Ya-Chin King, ¡§Reliability and Memory Characteristics of Sequential Laterally Solidified LTPS TFT with a ONO Stack Gate Dielectric¡¨, Proceeding for the 2005 International Conference on Solid State Devices and Materials, Tokyo, Japan

 

34.       Cheng-Hsiao, Liang-Wei Lai, and Ya-Chin King,¡§ A Logarithmic Response CMOS Image Sensor with Parasitic PNP BJT¡¨,Proceeding for the 2005 International Conference on Solid State Devices and Materials, pp. 940-941 Tokyo, Japan

 

35.       Wei-Cheng Lin and Ya-Chin King,¡§Reliability Evaluation of 5.2GHz CMOS Receiver¡¨, European Microwave Conference, France, October 2005